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Thermal and electrostatic reliability characterization in RF MEMS switches.

Q.-H. DuongLionel BuchaillotDominique CollardPetra SchmittXavier LafontanPatrick PonsF. FlourensFrancis Pressecq
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • infrared
  • radio frequency
  • relevance feedback
  • data sets
  • real time
  • neural network
  • image sequences
  • image retrieval
  • failure rate
  • reliability analysis
  • software reliability
  • high temperature
  • electrical properties