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Thermal and electrostatic reliability characterization in RF MEMS switches.
Q.-H. Duong
Lionel Buchaillot
Dominique Collard
Petra Schmitt
Xavier Lafontan
Patrick Pons
F. Flourens
Francis Pressecq
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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infrared
radio frequency
relevance feedback
data sets
real time
neural network
image sequences
image retrieval
failure rate
reliability analysis
software reliability
high temperature
electrical properties