M. Denais

Publication Activity (10 Years)

Years Active: 2005-2007
Publications (10 Years): 0

Publications

C. R. Parthasarathy, Alain Bravaix, Chloe Guérin, M. Denais, Vincent Huard
Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation. PATMOS (2007)
C. R. Parthasarathy, M. Denais, Vincent Huard, G. Ribes, David Roy, Chloe Guérin, F. Perrier, E. Vincent, Alain Bravaix
Designing in reliability in advanced CMOS technologies. Microelectron. Reliab. 46 (9-11) (2006)
Vincent Huard, M. Denais, C. R. Parthasarathy
NBTI degradation: From physical mechanisms to modelling. Microelectron. Reliab. 46 (1) (2006)
Vincent Huard, M. Denais, F. Perrier, Nathalie Revil, C. R. Parthasarathy, Alain Bravaix, E. Vincent
A thorough investigation of MOSFETs NBTI degradation. Microelectron. Reliab. 45 (1) (2005)
G. Ribes, S. Bruyère, M. Denais, David Roy, Gérard Ghibaudo
Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown. Microelectron. Reliab. 45 (5-6) (2005)
G. Ribes, S. Bruyère, M. Denais, Frederic Monsieur, Vincent Huard, David Roy, Gérard Ghibaudo
power-law voltage dependence of oxide breakdown in ultra-thin gate oxides. Microelectron. Reliab. 45 (12) (2005)
Alain Bravaix, Didier Goguenheim, M. Denais, Vincent Huard, C. R. Parthasarathy, F. Perrier, Nathalie Revil, E. Vincent
Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs. Microelectron. Reliab. 45 (9-11) (2005)