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Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown.
G. Ribes
S. Bruyère
M. Denais
David Roy
Gérard Ghibaudo
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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probability distribution
empirical evidence
generation process
database
information retrieval
decision trees
case study
multiscale
multiresolution