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A thorough investigation of MOSFETs NBTI degradation.
Vincent Huard
M. Denais
F. Perrier
Nathalie Revil
C. R. Parthasarathy
Alain Bravaix
E. Vincent
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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real time
information technology
viewpoint
real world
e learning
training data
digital libraries
hidden markov models
preliminary investigation