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NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI.

Ajith SivadasanRiddhi Jitendrakumar ShahVincent HuardFlorian CachoLorena Anghel
Published in: DATE (2018)
Keyphrases
  • critical path
  • digital circuits
  • job shop scheduling problem
  • data flow
  • model based diagnosis
  • circuit design
  • database
  • neural network
  • cost function
  • scheduling problem
  • optimization algorithm
  • functional decomposition