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NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI.
Ajith Sivadasan
Riddhi Jitendrakumar Shah
Vincent Huard
Florian Cacho
Lorena Anghel
Published in:
DATE (2018)
Keyphrases
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critical path
digital circuits
job shop scheduling problem
data flow
model based diagnosis
circuit design
database
neural network
cost function
scheduling problem
optimization algorithm
functional decomposition