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Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.
Alain Bravaix
Florian Cacho
X. Federspiel
C. Ndiaye
Souhir Mhira
Vincent Huard
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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low cost
cmos technology
high speed
power consumption
circuit design
shortest path
directed graph
silicon on insulator
information systems
missing data
low power
graph structure
analog vlsi
metal oxide semiconductor
nm technology