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Jacques Cluzel
Publication Activity (10 Years)
Years Active: 2014-2021
Publications (10 Years): 4
Top Topics
Interesting Patterns
Analog Vlsi
Supervised Machine Learning
Measurement Noise
Top Venues
ESSDERC
IRPS
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Publications
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Aby-Gaël Viey
,
William Vandendaele
,
Marie-Anne Jaud
,
Jean Coignus
,
Jacques Cluzel
,
Alexis Krakovinsky
,
Simon Martin
,
Jérome Biscarrat
,
Romain Gwoziecki
,
Veronique Sousa
,
Fred Gaillard
,
Roberto Modica
,
Ferdinando Iucolano
,
Matteo Meneghini
,
Gaudenzio Meneghesso
,
Gérard Ghibaudo
Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT.
IRPS
(2021)
R. Kom Kammeugne
,
C. Leroux
,
Tadeu Mota Frutuoso
,
Jacques Cluzel
,
L. Vauche
,
Cyrille Le Royer
,
Romain Gwoziecki
,
Xavier Garros
,
Fred Gaillard
,
Matthew Charles
,
E. Bano
,
Gérard Ghibaudo
Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs.
ESSDERC
(2021)
Louis Gerrer
,
Jacques Cluzel
,
Fred Gaillard
,
Xavier Garros
,
Xavier Federspiel
,
Florian Cacho
,
David Roy
,
E. Vincent
BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations.
IRPS
(2021)
B. Rrustemi
,
Aby-Gaël Viey
,
Marie-Anne Jaud
,
Francois Triozon
,
William Vandendaele
,
Charles Leroux
,
Jacques Cluzel
,
S. Martin
,
C. Le Royer
,
Romain Gwoziecki
,
Roberto Modica
,
Ferdinando Iucolano
,
Fred Gaillard
,
Thierry Poiroux
,
Gérard Ghibaudo
Reliable method for low field temperature dependent mobility extraction at Al2O3/GaN interface.
ESSDERC
(2021)
Carlos Navarro
,
Maryline Bawedin
,
François Andrieu
,
Jacques Cluzel
,
Xavier Garros
,
Sorin Cristoloveanu
CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes.
ESSDERC
(2014)