Jean Coignus

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 15

Top Topics

Leakage Current

Reliability Assessment

Contingency Tables

Top Venues

Microelectron. Reliab.

Publications

Olivier Billoint, Simon Martin, J. Laguerre, L. Hosier, Jean Coignus, Catherine Carabasse, François Andrieu, Laurent Grenouillet
Charge-based Sense Demonstration in 1T-1C HZO FeRAM Arrays to Overcome CBL-induced Bank Size Limitations. IMW (2024)
J. Laguerre, Simon Martin, Jean Coignus, Catherine Carabasse, Marc Bocquet, François Andrieu, Laurent Grenouillet
Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays. IRPS (2024)
J. Laguerre, Marc Bocquet, Olivier Billoint, S. Martin, Jean Coignus, Catherine Carabasse, T. Magis, T. Dewolf, François Andrieu, Laurent Grenouillet
Memory Window in Si: HfO2 FeRAM arrays: Performance Improvement and Extrapolation at Advanced Nodes. IMW (2023)
Laurent Grenouillet, Justine Barbot, J. Laguerre, Simon Martin, Catherine Carabasse, M. Louro, Messaoud Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, T. Magis, Carine Jahan, François Andrieu, Jean Coignus
Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited). IRPS (2023)
Justine Barbot, Jean Coignus, Nicolas Vaxelaire, Catherine Carabasse, Olivier Glorieux, Messaoud Bedjaoui, François Aussenac, François Andrieu, François Triozon, Laurent Grenouillet
Interplay between charge trapping and polarization switching in MFDM stacks evidenced by frequency-dependent measurements. ESSCIRC (2022)
Aby-Gaël Viey, William Vandendaele, Marie-Anne Jaud, Jean Coignus, Jacques Cluzel, Alexis Krakovinsky, Simon Martin, Jérome Biscarrat, Romain Gwoziecki, Veronique Sousa, Fred Gaillard, Roberto Modica, Ferdinando Iucolano, Matteo Meneghini, Gaudenzio Meneghesso, Gérard Ghibaudo
Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT. IRPS (2021)
Erika Covi, Quang T. Duong, Suzanne Lancaster, Viktor Havel, Jean Coignus, Justine Barbot, Ole Richter, Philipp Klein, Elisabetta Chicca, Laurent Grenouillet, Athanasios Dimoulas, Thomas Mikolajick, Stefan Slesazeck
Ferroelectric Tunneling Junctions for Edge Computing. ISCAS (2021)
Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. ESSCIRC (2021)
Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. ESSDERC (2021)
Riccardo Fontanini, Justine Barbot, M. Segatto, Suzanne Lancaster, Quang T. Duong, Francesco Driussi, Laurent Grenouillet, Francois Triozon, Jean Coignus, Thomas Mikolajick, Stefan Slesazeck, David Esseni
Polarization switching and interface charges in BEOL compatible Ferroelectric Tunnel Junctions. ESSDERC (2021)
Erika Covi, Quang T. Duong, Suzanne Lancaster, Viktor Havel, Jean Coignus, Justine Barbot, Ole Richter, Philipp Klein, Elisabetta Chicca, Laurent Grenouillet, Athanasios Dimoulas, Thomas Mikolajick, Stefan Slesazeck
Ferroelectric Tunneling Junctions for Edge Computing. CoRR (2021)
Jessy Micout, Quentin Rafhay, Xavier Garros, Mikaël Cassé, Jean Coignus, L. Pasini, Cao-Minh Vincent Lu, Nils Rambal, Claire Fenouillet-Béranger, Laurent Brunet, G. Romano, R. Gassilloud, Perrine Batude, Maud Vinet, Gérard Ghibaudo
Precise EOT regrowth extraction enabling performance analysis of low temperature extension first devices. ESSDERC (2017)
Adam Dobri, Simon Jeannot, Fausto Piazza, Carine Jahan, Jean Coignus, Luca Perniola, Francis Balestra
Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory. Microelectron. Reliab. 69 (2017)
Alexis Krakovinsky, Marc Bocquet, Romain Wacquez, Jean Coignus, Jean-Michel Portal
Thermal laser attack and high temperature heating on HfO2-based OxRAM cells. IOLTS (2017)
Giulio Torrente, Jean Coignus, Alexandre Vernhet, Jean-Luc Ogier, David Roy, Gérard Ghibaudo
Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology. Microelectron. Reliab. 79 (2017)
Giulio Torrente, Jean Coignus, Sophie Renard, Alexandre Vernhet, Gilles Reimbold, David Roy, Gérard Ghibaudo
Physically-based extraction methodology for accurate MOSFET degradation assessment. Microelectron. Reliab. 55 (9-10) (2015)