Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited).
Laurent GrenouilletJustine BarbotJ. LaguerreSimon MartinCatherine CarabasseM. LouroMessaoud BedjaouiS. MinoretS. KerdilèsC. BoixaderasT. MagisCarine JahanFrançois AndrieuJean CoignusPublished in: IRPS (2023)