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Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology.
Giulio Torrente
Jean Coignus
Alexandre Vernhet
Jean-Luc Ogier
David Roy
Gérard Ghibaudo
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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case study
data processing
rapid development
information technology
evaluation method
evaluation methods
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cmos technology
learning algorithm
technological advances
assessment tool