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Aby-Gaël Viey
ORCID
Publication Activity (10 Years)
Years Active: 2019-2022
Publications (10 Years): 4
Top Topics
Chemical Vapor Deposition
High Voltage
Structuring Elements
Prior Studies
Top Venues
IRPS
ESSDERC
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Publications
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Camille Leurquin
,
William Vandendaele
,
Aby-Gaël Viey
,
Romain Gwoziecki
,
René Escoffier
,
R. Salot
,
G. Despesse
,
Ferdinando Iucolano
,
Roberto Modica
,
A. Constant
Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.
IRPS
(2022)
Aby-Gaël Viey
,
William Vandendaele
,
Marie-Anne Jaud
,
Jean Coignus
,
Jacques Cluzel
,
Alexis Krakovinsky
,
Simon Martin
,
Jérome Biscarrat
,
Romain Gwoziecki
,
Veronique Sousa
,
Fred Gaillard
,
Roberto Modica
,
Ferdinando Iucolano
,
Matteo Meneghini
,
Gaudenzio Meneghesso
,
Gérard Ghibaudo
Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT.
IRPS
(2021)
B. Rrustemi
,
Aby-Gaël Viey
,
Marie-Anne Jaud
,
Francois Triozon
,
William Vandendaele
,
Charles Leroux
,
Jacques Cluzel
,
S. Martin
,
C. Le Royer
,
Romain Gwoziecki
,
Roberto Modica
,
Ferdinando Iucolano
,
Fred Gaillard
,
Thierry Poiroux
,
Gérard Ghibaudo
Reliable method for low field temperature dependent mobility extraction at Al2O3/GaN interface.
ESSDERC
(2021)
Aby-Gaël Viey
,
William Vandendaele
,
Marie-Anne Jaud
,
Romain Gwoziecki
,
A. Torres
,
Marc Plissonnier
,
Fred Gaillard
,
Gérard Ghibaudo
,
Roberto Modica
,
Ferdinando Iucolano
,
Matteo Meneghini
,
Gaudenzio Meneghesso
Influence of Gate Length on pBTI in GaN-on-Si E-Mode MOSc-HEMT.
IRPS
(2019)