Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.
Camille LeurquinWilliam VandendaeleAby-Gaël VieyRomain GwozieckiRené EscoffierR. SalotG. DespesseFerdinando IucolanoRoberto ModicaA. ConstantPublished in: IRPS (2022)