Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study.
Mathieu SicreMegan AgnewChristel BujJean CoignusDominique GolanskiRémi HelleboidBastien MamdyIsobel NicholsonSara PellegriniDenis RideauDavid RoyFrancis CalmonPublished in: ESSDERC (2021)