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Physically-based extraction methodology for accurate MOSFET degradation assessment.

Giulio TorrenteJean CoignusSophie RenardAlexandre VernhetGilles ReimboldDavid RoyGérard Ghibaudo
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • high precision
  • highly accurate
  • case study
  • knowledge extraction
  • machine learning
  • high quality
  • multi agent systems
  • information extraction
  • software engineering
  • quality assessment