Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study.

Mathieu Sicre Megan Agnew Christel Buj Jean Coignus Dominique Golanski Rémi Helleboid Bastien Mamdy Isobel Nicholson Sara Pellegrini Denis Rideau David Roy Francis Calmon

Published in: ESSCIRC (2021)

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