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CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes.

Carlos NavarroMaryline BawedinFrançois AndrieuJacques CluzelXavier GarrosSorin Cristoloveanu
Published in: ESSDERC (2014)
Keyphrases
  • high speed
  • low power
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  • power consumption
  • measurement noise
  • analog vlsi
  • vlsi circuits
  • database
  • data sets
  • high frequency
  • high density
  • digital signal processing
  • measurement data
  • cmos technology