Maryline Bawedin

Publication Activity (10 Years)

Years Active: 2013-2019
Publications (10 Years): 7

Top Topics

Cmos Technology

Silicon On Insulator

Negative Effects

Top Venues

Microelectron. Reliab.

Publications

Philippe Galy, R. Lethiecq, Maryline Bawedin
1T1C Ultra low power relative Thermal-Voltage sensor in 28nm UTBB FD-SOI CMOS technology for standard, spatial and quantum applications. ICICDT (2019)
R. Lethiecq, Maryline Bawedin, Philippe Galy
Compact MOS Structure & Design for Ion-Ioff Thermal control in 28nm UTBB FD-SOI CMOS technology. ICICDT (2019)
Kyunghwa Lee, Hassan El Dirani, Pascal Fonteneau, Maryline Bawedin, Shingo Sato, Sorin Cristoloveanu
-FET for fast logic applications. ESSDERC (2018)
Philippe Galy, R. Lethiecq, Maryline Bawedin
Optimized in situ heating control on a new MOS device structure in 28nm UTBB FD-SOI CMOS technology. ICICDT (2018)
Kyung Hwa Lee, Maryline Bawedin, Hyungjin Park, Mukta Singh Parihar, Sorin Cristoloveanu
Carrier lifetime evaluation in FD-SOI layers. ESSDERC (2017)
Sorin Cristoloveanu, Maryline Bawedin
FDSOI devices: Issues and innovative solutions. ESSDERC (2016)
Mukta Singh Parihar, Fan Yu Liu, Carlos Navarro, Sylvain Barraud, Maryline Bawedin, Irina Ionica, Abhinav Kranti, Sorin Cristoloveanu
Back-gate effects and detailed characterization of junctionless transistor. ESSDERC (2015)
Carlos Navarro, Maryline Bawedin, François Andrieu, Jacques Cluzel, Xavier Garros, Sorin Cristoloveanu
CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes. ESSDERC (2014)
G. A. Umana-Membreno, S.-J. Chang, Maryline Bawedin, J. Antoszewski, Sorin Cristoloveanu, L. Faraone
Mobility spectrum analysis of magnetoresistance in fully-depleted MOSFETs. ESSDERC (2014)
Carlos Navarro, Maryline Bawedin, François Andrieu, Bruno Sagnes, Sorin Cristoloveanu
Why are SCE overestimated in FD-SOI MOSFETs? ESSDERC (2013)
Sung-Jae Chang, Maryline Bawedin, Wade Xiong, Jong-Hyun Lee, Jung-Hee Lee, Sorin Cristoloveanu
Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects. Microelectron. Reliab. 53 (3) (2013)
Sung-Jae Chang, Sorin Cristoloveanu, Maryline Bawedin, Jong-Hyun Lee, Jung-Hee Lee, Sutirtha Mukhopadhyay, Benjamin A. Piot
Magnetoresistance measurements and unusual mobilitiy behavior in FD MOSFETs. ESSDERC (2013)