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Back-gate effects and detailed characterization of junctionless transistor.
Mukta Singh Parihar
Fan Yu Liu
Carlos Navarro
Sylvain Barraud
Maryline Bawedin
Irina Ionica
Abhinav Kranti
Sorin Cristoloveanu
Published in:
ESSDERC (2015)
Keyphrases
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field effect transistors
high speed
silicon dioxide
feature selection
image processing
negative effects
low power
steady state
case study
leakage current
integrated circuit
similarity measure
real time
knowledge base
artificial intelligence
information retrieval
machine learning
neural network
data sets