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Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications.

Tidjani Garba-SeybouXavier FederspielFrederic MonsieurMathieu SicreFlorian CachoJoycelyn HaiAlain Bravaix
Published in: IRPS (2023)
Keyphrases
  • transmission electron microscopy
  • information retrieval
  • state transitions
  • data sets
  • learning algorithm
  • mobile devices
  • hidden markov models
  • state space