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Comparison of Si and crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations.
Louis Gerrer
Vihar P. Georgiev
Salvatore M. Amoroso
Ewan Towie
A. Asenov
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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distance transform
hamilton jacobi
heat equation
wave equation
neural network
high speed
eikonal equation
image processing
scale space
failure rate
poisson process
image brightness