Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.
Louis GerrerJie DingSalvatore M. AmorosoFikru Adamu-LemaRazaidi HussinDave ReidCampbell MillarA. AsenovPublished in: Microelectron. Reliab. (2014)
Keyphrases
- low voltage
- semiconductor devices
- high speed
- artificial intelligence
- literature review
- neural network
- field effect transistors
- circuit design
- data acquisition
- databases
- finite element
- digital circuits
- electron beam
- cmos technology
- analog circuits
- relevant literature
- learning environment
- machine learning
- electronic circuits
- power reduction
- delay insensitive
- portable devices