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Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology.
Xingsheng Wang
Binjie Cheng
Jente B. Kuang
Andrew R. Brown
Campbell Millar
Asen Asenov
Published in:
IEEE Des. Test (2013)
Keyphrases
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case study
cmos technology
power consumption
nm technology
enabling technology
silicon on insulator
participatory design
design process
low power
design methodology
information systems
graph structure
interaction design
cost effective
statistical analysis
power reduction
information technology