Victor Moroz

Publication Activity (10 Years)

Years Active: 1998-2023
Publications (10 Years): 6

Top Topics

Leakage Current

Top Venues

VLSI Technology and Circuits

Microelectron. Reliab.

Publications

Victor Moroz, Alexei Svizhenko, Munkang Choi, Plamen Asenov, Jaehyun Lee
Exploring Power Savings of Gate-All-Around Cryogenic Technology. VLSI Technology and Circuits (2023)
Victor Moroz
Gate-All-Around Technology is Coming.: What's Next After GAA? ISPD (2023)
Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma
TCAD modeling for reliability. Microelectron. Reliab. (2018)
Jin-Woo Han, Victor Moroz, Andrey Kucherov, Dinesh Maheshwari, Valentin Abramzon, Zvi Or-Bach, Yoshio Nishi, Yuniarto Widjaja
A CMOS-compatible boosted transistor having >2× drive current and low leakage current. ESSDERC (2016)
Victor Moroz
Technology Inflection Points. ISPD (2016)
Victor Moroz, Joanne Huang, Reza Arghavani
Transistor design for 5nm and beyond: Slowing down electrons to speed up transistors. ISQED (2016)
Xi-Wei Lin, Victor Moroz
Layout Proximity Effects and Modeling Alternatives for IC Designs. IEEE Des. Test Comput. 27 (2) (2010)
Aditya P. Karmarkar, Xiaopeng Xu, Victor Moroz, Greg Rollins, Xiao Lin
Analysis of performance and reliability trade-off in dummy pattern design for 32-nm technology. ISQED (2009)
Victor Moroz, Lee Smith, Xi-Wei Lin, Dipu Pramanik, Greg Rollins
Stress-Aware Design Methodology. ISQED (2006)
Sridhar Tirumala, Yuri Mahotin, Xiao Lin, Victor Moroz, Lee Smith, S. Krishnamurthy, L. Bomholt, Dipu Pramanik
Bringing Manufacturing into Design via Process-Dependent SPICE Models. ISQED (2006)
Dan Wake, Klas Lilja, Victor Moroz
A Hybrid Mesh Generation Method for Two and Three Dimensional Simulation of Semiconductor Processes and Devices. IMR (1998)