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TCAD modeling for reliability.

Paul PfäffliHiu Yung WongX. XuL. SilvestriX. W. LinT. YangRavi TiwariSouvik MahapatraSteve MotznyVictor MorozTerry Ma
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • computer aided design
  • databases
  • multimedia
  • three dimensional
  • preprocessing
  • artificial neural networks
  • significant improvement
  • special case
  • virtual environment
  • modeling framework