Souvik Mahapatra

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 24

Top Topics

Stochastic Optimization Problems

Modeling Framework

Top Venues

Microelectron. Reliab.

VLSI Technology and Circuits

Publications

Leitao Liu, Jingtian Fang, Ashish Pal, Plamen Asenov, Mohit Bajaj, Bei Deng, Xi-Wei Lin, Souvik Mahapatra, Subi Kengeri, El Mehdi Bazizi
Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology. IRPS (2024)
Karansingh Thakor, Payel Chatterjee, Souvik Mahapatra
A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions. IRPS (2024)
Karansingh Thakor, Nikhil Rangarajan, Himanshu Diwakar, Rashmi Saikia, Tarun Samadder, Souvik Mahapatra, Shyam Raghunathan, Yingda Dong
Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories. IMW (2024)
Priyankka Gundlapudi Ravikumar, Prasanna Venkatesan Ravindran, Khandker Akif Aabrar, Taeyoung Song, Sharadindu Gopal Kirtania, Dipjyoti Das, Chinsung Park, Nashrah Afroze, Mengkun Tian, Shimeng Yu, Ahmad Ehtesham Islam, Suman Datta, Souvik Mahapatra, Asif Islam Khan
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions. IRPS (2024)
Rashmi Saikia, Himanshu Rai, Souvik Mahapatra
Modeling of Post-Cycling Retention Bake in 3-D CTF TLC NAND Arrays. IRPS (2024)
Rashmi Saikia, Aseer Ansari, Souvik Mahapatra
A Physics-based Model for Long Term Data Retention Characteristics in 3D NAND Flash Memory. IRPS (2023)
Nirmaan Shanker, Li-Chen Wang, Suraj Cheema, Wenshen Li, Nilotpal Choudhury, Chenming Hu, Souvik Mahapatra, Sayeef S. Salahuddin
On the PBTI Reliability of Low EOT Negative Capacitance 1.8 nm HfO2-ZrO2 Superlattice Gate Stack on Lg=90 nm nFETs. VLSI Technology and Circuits (2022)
Himanshu Diwakar, Karansingh Thakor, Souvik Mahapatra
Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs. IRPS (2022)
Nilotpal Choudhury, Ayush Ranjan, Souvik Mahapatra
Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress. IRPS (2022)
Nilotpal Choudhury, Tarun Samadder, Ravi Tiwari, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra
Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. IRPS (2021)
Dimple Kochar, Tarun Samadder, Subhadeep Mukhopadhyay, Souvik Mahapatra
Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI. IRPS (2021)
Satyam Kumar, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. IRPS (2021)
Tarun Samadder, Satyam Kumar, Karansingh Thakor, Souvik Mahapatra
A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake. IRPS (2021)
Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. IRPS (2020)
Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs. IRPS (2020)
Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra
Hot Carrier Degradation in Cryo-CMOS. IRPS (2020)
Nilotpal Choudhury, Narendra Parihar, Souvik Mahapatra
Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range. IRPS (2020)
Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. Very Large Scale Integr. Syst. 27 (7) (2019)
Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, James H. Stathis, Souvik Mahapatra
On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs. IRPS (2019)
James H. Stathis, Souvik Mahapatra, Tibor Grasser
Controversial issues in negative bias temperature instability. Microelectron. Reliab. 81 (2018)
Narendra Parihar, Souvik Mahapatra
Prediction of NBTI stress and recovery time kinetics in Si capped SiGe p-MOSFETs. IRPS (2018)
Souvik Mahapatra, Narendra Parihar
A review of NBTI mechanisms and models. Microelectron. Reliab. 81 (2018)
Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma
TCAD modeling for reliability. Microelectron. Reliab. (2018)
Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
Aging-aware voltage scaling. DATE (2016)
Ankush Chaudhary, Ben Kaczer, Philippe J. Roussel, Thomas Chiarella, Naoto Horiguchi, Souvik Mahapatra
Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI. IRPS (2015)
Nilesh Goel, Tejas Naphade, Souvik Mahapatra
Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress. IRPS (2015)
Nilesh Goel, Kaustubh Joshi, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. Microelectron. Reliab. 54 (3) (2014)