Victor M. van Santen

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 30

Top Topics

Application Level

Design Automation

Massively Parallel

Top Venues

IEEE Trans. Circuits Syst. I Regul. Pap.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Tarek Mohamed, Victor M. van Santen, Lilas Alrahis, Ozgur Sinanoglu, Hussam Amrouch
Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Trans. Circuits Syst. I Regul. Pap. 71 (7) (2024)
Hussam Amrouch, Victor M. van Santen, Javier Diaz-Fortuny, Florian Klemme
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper). IRPS (2024)
Victor M. van Santen, Fu Lam Florian Diep, Jörg Henkel, Hussam Amrouch
Massively Parallel Circuit Setup in GPU-SPICE. IEEE Trans. Computers 72 (8) (2023)
Divya Praneetha Ravipati, Victor M. van Santen, Sami Salamin, Hussam Amrouch, Preeti Ranjan Panda
Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Trans. Very Large Scale Integr. Syst. 31 (9) (2023)
Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. DFT (2023)
Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez, Rafael Castro-López, Elisenda Roca, Hussam Amrouch
Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. IRPS (2023)
Victor M. van Santen, Marcel Walter, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Robert Wille, Hussam Amrouch
Design Automation for Cryogenic CMOS Circuits. DAC (2023)
Shivendra Singh Parihar, Victor M. van Santen, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch
Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (8) (2023)
Divya Praneetha Ravipati, Rajesh Kedia, Victor M. van Santen, Jörg Henkel, Preeti Ranjan Panda, Hussam Amrouch
FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies. IEEE Trans. Very Large Scale Integr. Syst. 30 (3) (2022)
Paul R. Genssler, Victor M. van Santen, Jörg Henkel, Hussam Amrouch
On the Reliability of FeFET On-Chip Memory. IEEE Trans. Computers 71 (4) (2022)
Victor M. van Santen, Linda Schillinger, Hussam Amrouch
Self-Heating Effects from Transistors to Gates. VLSI-DAT (2021)
Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. VTS (2021)
Sami Salamin, Victor M. van Santen, Martin Rapp, Jörg Henkel, Hussam Amrouch
Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient. IEEE Access 9 (2021)
Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan
Special Session: Machine Learning for Semiconductor Test and Reliability. VTS (2021)
Victor M. van Santen, Hussam Amrouch, Pooja Kumari, Jörg Henkel
On the Workload Dependence of Self-Heating in FinFET Circuits. IEEE Trans. Circuits Syst. II Express Briefs (10) (2020)
Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. ASP-DAC (2020)
Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. IRPS (2020)
Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch
Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities. ICCAD (2020)
Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel
NCFET to Rescue Technology Scaling: Opportunities and Challenges. ASP-DAC (2020)
Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. Very Large Scale Integr. Syst. 27 (7) (2019)
Victor M. van Santen, Hussam Amrouch, Jörg Henkel
Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Trans. Circuits Syst. II Express Briefs (9) (2019)
Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel
Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS (2019)
Victor M. van Santen, Hussam Amrouch, Jörg Henkel
Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2019)
Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. IEEE Trans. Circuits Syst. I Regul. Pap. (1) (2018)
Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Jörg Henkel, Montserrat Nafría
Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability. IRPS (2018)
Victor M. van Santen, Hussam Amrouch, Jörg Henkel
Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE. IOLTS (2018)
Hussam Amrouch, Victor M. van Santen, Jörg Henkel
Estimating and optimizing BTI aging effects: from physics to CAD. ICCAD (2018)
Hussam Amrouch, Victor M. van Santen, Jörg Henkel
Interdependencies of Degradation Effects and Their Impact on Computing. IEEE Des. Test 34 (3) (2017)
Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
Aging-aware voltage scaling. DATE (2016)
Victor M. van Santen, Hussam Amrouch, Javier Martín-Martínez, Montserrat Nafría, Jörg Henkel
Designing guardbands for instantaneous aging effects. DAC (2016)
Hussam Amrouch, Javier Martín-Martínez, Victor M. van Santen, Miquel Moras, Rosana Rodríguez, Montserrat Nafría, Jörg Henkel
Connecting the physical and application level towards grasping aging effects. IRPS (2015)
Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel
Towards interdependencies of aging mechanisms. ICCAD (2014)