Om Prakash

Publication Activity (10 Years)

Years Active: 2019-2023
Publications (10 Years): 17

Top Topics

Analog Circuits

Adaptive Window

Parallel Search

Reliability Analysis

Top Venues

IEEE Trans. Circuits Syst. I Regul. Pap.

Publications

Om Prakash, Kai Ni, Hussam Amrouch
Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness. IRPS (2023)
Om Prakash, Rodion Novkin, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Ramesh Karri, Farshad Khorrami, Hussam Amrouch
Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. ISCAS (2023)
Navjeet Bagga, Kai Ni, Nitanshu Chauhan, Om Prakash, X. Sharon Hu, Hussam Amrouch
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. IRPS (2022)
Kai Ni, Om Prakash, Simon Thomann, Zijian Zhao, Shan Deng, Hussam Amrouch
Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications. IRPS (2022)
Om Prakash, Kai Ni, Hussam Amrouch
Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing. IRPS (2022)
Om Prakash, Chetan K. Dabhi, Yogesh Singh Chauhan, Hussam Amrouch
Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. VTS (2021)
Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. VTS (2021)
Aniket Gupta, Nitanshu Chauhan, Om Prakash, Hussam Amrouch
Variability Effects in FinFET Transistors and Emerging NC-FinFET. ICICDT (2021)
Om Prakash, Nitanshu Chauhan, Aniket Gupta, Hussam Amrouch
Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology. Microelectron. J. 115 (2021)
Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS (2021)
Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. ASP-DAC (2020)
Aniket Gupta, Kai Ni, Om Prakash, Xiaobo Sharon Hu, Hussam Amrouch
Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET. IRPS (2020)
Om Prakash, Hussam Amrouch, Sanjeev Manhas, Jörg Henkel
Impact of NBTI Aging on Self-Heating in Nanowire FET. DATE (2020)
Govind Bajpai, Aniket Gupta, Om Prakash, Girish Pahwa, Jörg Henkel, Yogesh Singh Chauhan, Hussam Amrouch
Impact of Radiation on Negative Capacitance FinFET. IRPS (2020)
Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan
Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. (9) (2020)
Kai Ni, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch
Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. IRPS (2020)
Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel
Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS (2019)