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Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.

Aniket GuptaGovind BajpaiPriyanshi SinghalNavjeet BaggaOm PrakashShashank BanchhorHussam AmrouchNitanshu Chauhan
Published in: IRPS (2021)
Keyphrases
  • high speed
  • positive and negative
  • high frequency
  • data sets
  • search engine
  • decision trees
  • database systems
  • similarity measure
  • multiresolution
  • low power
  • reliability analysis