Navjeet Bagga

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 13

Top Topics

Spatial Features

Electric Arc Furnace

Reliability Assessment

Top Venues

Microelectron. J.

Publications

Jyoti Patel, Navjeet Bagga, Vivek Kumar, S. Dasgupta
Small Signal Analysis of Nanosheet Transistor for sub-THz Frequency Considering Intersheet Capacitances and Modified Admittance Parameters. DRC (2024)
Sunil Rathore, Navjeet Bagga, S. Dasgupta
Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET. IRPS (2024)
Sunil Rathore, Rajeewa Kumar Jaisawal, Pravin Neminath Kondekar, Navjeet Bagga
Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET. Microelectron. J. 139 (2023)
Navneet Gandhi, Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Ankit Dixit, Navneen Kumar, Vihar Georgiev, Navjeet Bagga
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. SENSORS (2023)
Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET. IRPS (2023)
Sunil Rathore, Rajeewa Kumar Jaisawal, Navneet Gandhi, P. N. Kondekar, Navjeet Bagga
Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor. Microelectron. J. 129 (2022)
Nitanshu Chauhan, Chirag Garg, Kai Ni, Amit Kumar Behera, Sarita Yadav, Shashank Banchhor, Navjeet Bagga, Avirup Dasgupta, Arnab Datta, Sudeb Dasgupta, Anand Bulusu
Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI. IRPS (2022)
Navjeet Bagga, Kai Ni, Nitanshu Chauhan, Om Prakash, X. Sharon Hu, Hussam Amrouch
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. IRPS (2022)
Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Navjeet Bagga
Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α). VDAT (2022)
Toushik Santra, Ankit Dixit, Rajeewa Kumar Jaisawal, Sunil Rathore, Saheli Sarkhel, Navjeet Bagga
buried negative capacitance SOI FET. Microelectron. J. 130 (2022)
Aniket Gupta, Govind Bajpai, Navjeet Bagga, Shashank Banchhor, Sudeb Dasgupta, Anand Bulusu, Nitanshu Chauhan
Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective. VDAT (2022)
Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS (2021)
Nitanshu Chauhan, Govind Bajpai, Shashank Banchhor, Navjeet Bagga
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification. VDAT (2020)