Login / Signup
Rajeewa Kumar Jaisawal
ORCID
Publication Activity (10 Years)
Years Active: 2022-2023
Publications (10 Years): 7
Top Topics
Nano Scale
Low Power
Reliability Assessment
Electric Arc Furnace
Top Venues
Microelectron. J.
IRPS
SENSORS
VDAT
</>
Publications
</>
Sunil Rathore
,
Rajeewa Kumar Jaisawal
,
Pravin Neminath Kondekar
,
Navjeet Bagga
Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET.
Microelectron. J.
139 (2023)
Navneet Gandhi
,
Rajeewa Kumar Jaisawal
,
Sunil Rathore
,
P. N. Kondekar
,
Ankit Dixit
,
Navneen Kumar
,
Vihar Georgiev
,
Navjeet Bagga
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor.
SENSORS
(2023)
Sunil Rathore
,
Rajeewa Kumar Jaisawal
,
P. N. Kondekar
,
Navneet Gandhi
,
Shashank Banchhor
,
Young Suh Song
,
Navjeet Bagga
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET.
IRPS
(2023)
Sunil Rathore
,
Rajeewa Kumar Jaisawal
,
Navneet Gandhi
,
P. N. Kondekar
,
Navjeet Bagga
Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor.
Microelectron. J.
129 (2022)
Rajeewa Kumar Jaisawal
,
P. N. Kondekar
,
Sameer Yadav
,
Pranshoo Upadhyay
,
Bhaskar Awadhiya
,
Sunil Rathore
Insights into the operation of negative capacitance FinFET for low power logic applications.
Microelectron. J.
119 (2022)
Rajeewa Kumar Jaisawal
,
Sunil Rathore
,
P. N. Kondekar
,
Navjeet Bagga
Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α).
VDAT
(2022)
Toushik Santra
,
Ankit Dixit
,
Rajeewa Kumar Jaisawal
,
Sunil Rathore
,
Saheli Sarkhel
,
Navjeet Bagga
buried negative capacitance SOI FET.
Microelectron. J.
130 (2022)