P. N. Kondekar

Publication Activity (10 Years)

Years Active: 2021-2023
Publications (10 Years): 8

Top Topics

Reliability Assessment

Electric Arc Furnace

Top Venues

Microelectron. J.

Publications

Navneet Gandhi, Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Ankit Dixit, Navneen Kumar, Vihar Georgiev, Navjeet Bagga
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. SENSORS (2023)
Sameer Yadav, P. N. Kondekar, Bhaskar Awadhiya
Performance estimation of non-hysteretic negative capacitance FinFET based SRAM. Microelectron. J. 137 (2023)
Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET. IRPS (2023)
Sunil Rathore, Rajeewa Kumar Jaisawal, Navneet Gandhi, P. N. Kondekar, Navjeet Bagga
Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor. Microelectron. J. 129 (2022)
Rajeewa Kumar Jaisawal, P. N. Kondekar, Sameer Yadav, Pranshoo Upadhyay, Bhaskar Awadhiya, Sunil Rathore
Insights into the operation of negative capacitance FinFET for low power logic applications. Microelectron. J. 119 (2022)
Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Navjeet Bagga
Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α). VDAT (2022)
Sameer Yadav, P. N. Kondekar, Pranshoo Upadhyay, Bhaskar Awadhiya
Negative capacitance based phase-transition FET for low power applications: Device-circuit co-design. Microelectron. J. 123 (2022)
Gargi Nandi, Sameer Yadav, P. N. Kondekar
A Fast Settling, High Slew Rate CMOS Recycling Folded Cascode Operational Transconductance Amplifier (OTA) for High Speed Applications. ICCCNT (2021)