Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor.
Navneet GandhiRajeewa Kumar JaisawalSunil RathoreP. N. KondekarAnkit DixitNavneen KumarVihar GeorgievNavjeet BaggaPublished in: SENSORS (2023)
Keyphrases
- reliability assessment
- leakage current
- field effect transistors
- silicon dioxide
- bp neural network model
- power system
- steady state
- sensor data
- genetic algorithm
- sensor networks
- real time
- multiple input
- data acquisition
- electrical properties
- fuel cell
- data sets
- room temperature
- genetic search
- electron microscopy
- high density
- multi sensor
- sensory data
- multi layer
- data fusion
- markov chain
- nano scale
- high speed
- decision making
- machine learning