Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective.
Aniket GuptaGovind BajpaiNavjeet BaggaShashank BanchhorSudeb DasguptaAnand BulusuNitanshu ChauhanPublished in: VDAT (2022)
Keyphrases
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