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Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.

Navjeet BaggaKai NiNitanshu ChauhanOm PrakashX. Sharon HuHussam Amrouch
Published in: IRPS (2022)
Keyphrases
  • field effect transistors
  • data storage
  • storage requirements
  • real time
  • cost effective
  • storage systems
  • microscopy images
  • data sets
  • data mining
  • markov chain
  • multi layer
  • storage and retrieval
  • processing capabilities