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On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.
Simon Thomann
Chao Li
Cheng Zhuo
Om Prakash
Xunzhao Yin
Xiaobo Sharon Hu
Hussam Amrouch
Published in:
VTS (2021)
Keyphrases
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memory requirements
parallel search
power consumption
main memory
resource consumption
memory size
digital libraries
memory usage
computing power