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On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.

Simon ThomannChao LiCheng ZhuoOm PrakashXunzhao YinXiaobo Sharon HuHussam Amrouch
Published in: VTS (2021)
Keyphrases
  • memory requirements
  • parallel search
  • power consumption
  • main memory
  • resource consumption
  • memory size
  • digital libraries
  • memory usage
  • computing power