Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning.
Om PrakashRodion NovkinVirinchi Roy SurabhiPrashanth KrishnamurthyRamesh KarriFarshad KhorramiHussam AmrouchPublished in: ISCAS (2023)
Keyphrases
- deep learning
- reliability analysis
- unsupervised feature learning
- machine learning
- unsupervised learning
- power consumption
- silicon on insulator
- weakly supervised
- mental models
- real world
- object recognition
- artificial intelligence
- condition monitoring
- data mining
- expert systems
- high dimensional
- knowledge discovery
- image segmentation
- power plant
- information retrieval
- leakage current
- neural network