Reliability Challenges with Self-Heating and Aging in FinFET Technology.
Hussam AmrouchVictor M. van SantenOm PrakashHammam KattanSami SalaminSimon ThomannJörg HenkelPublished in: IOLTS (2019)
Keyphrases
- lessons learned
- rapid development
- case study
- key issues
- technical aspects
- technical challenges
- software aging
- reliability analysis
- technological advances
- data processing
- personal computer
- key technologies
- cost effective
- technical issues
- future trends
- radio frequency identification rfid
- real time
- real world
- widespread adoption
- enterprise search
- technical solutions
- neural network