Sign in

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.

Victor M. van SantenSimon ThomannChaitanya PasupuletiPaul R. GensslerNarendra GangwarUma SharmaJörg HenkelSouvik MahapatraHussam Amrouch
Published in: IRPS (2020)
Keyphrases
  • random access memory
  • design considerations
  • low voltage
  • human activities
  • embedded dram
  • flash memory
  • power consumption
  • key factors
  • memory access
  • read write