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Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits.
Victor M. van Santen
Florian Klemme
Paul R. Genssler
Hussam Amrouch
Published in:
DFT (2023)
Keyphrases
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circuit design
lessons learned
high speed
machine learning algorithms
machine learning
key issues
real world
cmos technology
technical challenges
neural network
floating gate
machine learning approaches
flip flops
vlsi circuits
reliability analysis
high density
robust estimation
integrated circuit
power consumption