Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.
Victor M. van SantenJavier Diaz-FortunyHussam AmrouchJavier Martín-MartínezRosana RodríguezRafael Castro-LópezElisenda RocaFrancisco V. FernándezJörg HenkelMontserrat NafríaPublished in: IRPS (2018)