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Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks.
Victor M. van Santen
Simon Thomann
Yogesh S. Chauchan
Jörg Henkel
Hussam Amrouch
Published in:
VTS (2021)
Keyphrases
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optimization process
power consumption
power system
optimization algorithm
random access memory
memory usage
constrained optimization
data driven
optimization problems
global optimization
low voltage
real time
particle swarm optimization
low power
sensor networks
information technology
neural network
memory space