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Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.

Victor M. van SantenJavier Martín-MartínezHussam AmrouchMontserrat NafríaJörg Henkel
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
  • unified model
  • databases
  • information systems
  • database
  • feature selection
  • multimedia
  • failure rate