Paul Pfäffli

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 1

Top Topics

Computer Aided Design

Reliability Analysis

Highly Reliable

Top Venues

Microelectron. Reliab.

Publications

Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma
TCAD modeling for reliability. Microelectron. Reliab. (2018)
Paul Pfäffli, P. Tikhomirov, X. Xu, I. Avci, Y.-S. Oh, P. Balasingam, S. Krishnamoorthy, T. Ma
TCAD for reliability. Microelectron. Reliab. 52 (9-10) (2012)
Michael Schenkel, Paul Pfäffli, Wolfgang Wilkening, D. Aemmer, Wolfgang Fichtner
Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation. Microelectron. Reliab. 41 (6) (2001)