Y.-S. Oh

Publication Activity (10 Years)

Years Active: 2012-2012
Publications (10 Years): 0

Top Topics

Reliability Assessment

Highly Reliable

Software Reliability

Top Venues

Microelectron. Reliab.

Publications

Paul Pfäffli, P. Tikhomirov, X. Xu, I. Avci, Y.-S. Oh, P. Balasingam, S. Krishnamoorthy, T. Ma
TCAD for reliability. Microelectron. Reliab. 52 (9-10) (2012)