Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress.
Nilesh GoelTejas NaphadeSouvik MahapatraPublished in: IRPS (2015)
Keyphrases
- mathematical model
- probabilistic model
- high level
- prior knowledge
- neural network
- experimental data
- computational model
- probability distribution
- conceptual model
- steady state
- theoretical framework
- input data
- management system
- cost function
- data structure
- similarity measure
- information systems
- learning algorithm
- machine learning