Nilesh Goel

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 8

Top Topics

Spatio Temporal

Pavement Distress

Image Recognition

Top Venues

Int. J. Circuit Theory Appl.

Publications

Jani Babu Shaik, Siona Menezes Picardo, Sonal Singhal, Nilesh Goel
Reliability-aware design of Integrate-and-Fire silicon neurons. Integr. 94 (2024)
Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel
Impact of various NBTI distributions on SRAM performance for FinFET technology. Integr. 83 (2022)
Jani Babu Shaik, Rohit Singh, Siona Menezes Picardo, Nilesh Goel, Sonal Singhal
Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits. CoRR (2022)
Siona Menezes Picardo, Jani Babu Shaik, Sonal Singhal, Nilesh Goel
Enabling efficient rate and temporal coding using reliability-aware design of a neuromorphic circuit. Int. J. Circuit Theory Appl. 50 (12) (2022)
Jani Babu Shaik, Aadhitiya VS, Sonal Singhal, Nilesh Goel
Reliability-aware design of temporal neuromorphic encoder for image recognition. Int. J. Circuit Theory Appl. 50 (4) (2022)
Aadhitiya VS, Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel
Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition. CoRR (2022)
Jani Babu Shaik, Sonal Singhal, Nilesh Goel
Analysis of SRAM metrics for data dependent BTI degradation and process variability. Integr. 72 (2020)
Sarthak Prakash Chaudhari, Jani Babu Shaik, Sonal Singhal, Nilesh Goel
Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation. iSES (2018)
Nilesh Goel, Tejas Naphade, Souvik Mahapatra
Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress. IRPS (2015)
Nilesh Goel, P. Dubey, J. Kawa, S. Mahapatra
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages. IRPS (2015)
Nilesh Goel, Kaustubh Joshi, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. Microelectron. Reliab. 54 (3) (2014)