Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages.

Nilesh Goel P. Dubey J. Kawa S. Mahapatra

Published in: IRPS (2015)

Keyphrases

power consumption
transmission line
database
data sets
information systems
face recognition
software product line
cmos technology
leakage current
dynamic random access memory