Login / Signup

A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs.

Nilesh GoelKaustubh JoshiS. MukhopadhyayN. NanawareSouvik Mahapatra
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • modeling framework
  • language learning