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A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs.
Nilesh Goel
Kaustubh Joshi
S. Mukhopadhyay
N. Nanaware
Souvik Mahapatra
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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modeling framework
language learning