Hot Carrier Degradation in Cryo-CMOS.

Wriddhi Chakraborty Uma Sharma Suman Datta Souvik Mahapatra

Published in: IRPS (2020)

Keyphrases

electron microscopy
high speed
analog vlsi
vlsi circuits
low cost
power supply
circuit design
low power
hd video
delay insensitive
power consumption
low voltage
x ray
focal plane
cmos image sensor
artificial intelligence
hot topics
machine learning
random access memory
databases
data sets
database