Huimei Zhou

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 10

Top Topics

Reliability Analysis

Spatial Clustering

Surface Orientation

Silicon Dioxide

Top Venues

Publications

Huimei Zhou, Miaomiao Wang, Ernest Y. Wu
Challenges of Gate Stack TDDB in Gate-All-Around Nanosheet Towards Further Scaling. IRPS (2024)
Ernest Y. Wu, Brian T. McGowan, Ronald Bolam, Huai Huang, Huimei Zhou, Miaomiao Wang
A New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter Extraction. IRPS (2024)
Huimei Zhou, Miaomiao Wang, Nicolas Loubet, Andrew Gaul, Yasir Sulehria
Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices. IRPS (2023)
Huimei Zhou, Miaomiao Wang, Ruqiang Bao, Curtis Durfee, Liqiao Qin, Jingyun Zhang
SiGe Gate-All-around Nanosheet Reliability. IRPS (2022)
Huimei Zhou, Miaomiao Wang, Ruqiang Bao, Tian Shen, Ernest Wu, Richard G. Southwick, Jingyun Zhang, Veeraraghavan S. Basker, Dechao Guo
TDDB Reliability in Gate-All-Around Nanosheet. IRPS (2021)
Nilotpal Choudhury, Tarun Samadder, Ravi Tiwari, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra
Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. IRPS (2021)
Huimei Zhou, Miaomiao Wang, Jingyun Zhang, Koji Watanabe, Curtis Durfee, Shogo Mochizuki, Ruqiang Bao, Richard G. Southwick, Maruf Bhuiyan, Basker Veeraraghavan
NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor. IRPS (2020)
Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs. IRPS (2020)
Tian Shen, Koji Watanabe, Huimei Zhou, Michael Belyansky, Erin Stuckert, Jingyun Zhang, Andrew Greene, Veeraraghavan S. Basker, Miaomiao Wang
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability. IRPS (2020)
Miaomiao Wang, Jingyun Zhang, Huimei Zhou, Richard G. Southwick, Robin Hsin Kuo Chao, Xin Miao, Veeraraghavan S. Basker, Tenko Yamashita, Dechao Guo, Gauri Karve, Huiming Bu, James H. Stathis
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor. IRPS (2019)